High resolution spectroscopy using Bent Laue Analyzers

This document explains the use of software developed to process the data generated by the spectrometer built by Jeremy Kropf at the MRCAT beamline at Sector 10 at the Advanced Photon Source.

This spectrometer uses a bent Laue analyzer to disperse an emission line from a sample onto the face of a Dectris Pilatus photon-counting area detector, as shown in this photo:

Contents:

• The bent Laue experiment
  • Overview of the BLA measurement
  • High energy resolution fluorescence detection (HERFD)
  • Non-resonant X-ray Emission Spectroscopy (XES)
  • Resonant Inelastic X-ray Scattering (RIXS)
• The bla program
  • Usage
  • Contents
• The Metis program
  • Table of Contents
  • Menu bar
• Plotting and visualization
  • Plotting raw images and masks
  • Surface plots of RXES
• Programming documentation
  • Xray::BLA
  • Xray::BLA::IO
  • Xray::BLA::Image
  • Xray::BLA::Mask
  • Xray::BLA::Pause
  • Xray::BLA::Plot
  • Xray::BLA::Return
  • Xray::BLA::Tools
  • Demeter::UI::Metis
  • Demeter::UI::Metis::Files
  • Demeter::UI::Metis::Mask
  • Demeter::UI::Metis::Data
  • Demeter::UI::Metis::Config
  • Demeter::UI::Metis::Cursor
  • Demeter::UI::Metis::PluckPoint
  • Demeter::UI::Metis::LastPlot

Todo

page for pilplot

---

Xray::BLA and METIS are copyright © 2011-2014, 2016 Bruce Ravel and Jeremy Kropf – This document is copyright © 2016 Bruce Ravel

This document is licensed under The Creative Commons Attribution-ShareAlike License.

If this software and its documentation are useful to you, please consider supporting The Creative Commons.